CMM-based feature inspection, reverse engineering
April 18th 2009 01:21 am By Web Development in India
Metris has launched the XC50-LS cross scanner with long stand-off distance for CMM-based feature inspection and reverse engineering applications at Control 2006.
Metris has launched the XC50-LS cross scanner with long stand-off distance for CMM-based feature inspection and reverse engineering applications at Control 2006.
The patented cross scanner technology combines three laser stripes into a single sensor, enabling efficient scanning of features such as holes and slots without having to re-orientate the sensor.
With its 180 mm stand-off distance the XC50-LS enables scanning into deep pockets and over clamps.
Furthermore, while scanning regular surfaces, the XC50-LS can work in single stripe mode as such measuring as a standard LC50 laser scanner.
Laser scanners have a proven track record in first article inspection, production quality control and problem troubleshooting.
Compared to touch probe measurements, laser scanning provides faster measurements and full part information.
A single scan of a traditional line scanner very often does not provide enough information to inspect features like holes, slots and gap and step.
In this case multiple scans with different orientations of the scanner would be needed.
This not only requires a motorized 6th axis (C-axis) on the CMM, but will inevitably increase the total measurement time.
The patented cross scanner technology combines three line scanners each rotated over 120deg into a single sensor, eliminating the need to scan features multiple times to get enough information for inspection purposes.
As each of the laser is slightly tilted, the cross scanner additionally can look into features providing real 3D information.
The XC50 cross scanner has been first introduced by Metris in 2004 and has been proven to be very effective in many customer applications.
The new XC50-LS features a 180 mm stand-off distance -the distance between camera and measurement object- which enables the scanner to look into deep pockets which are typical for body panels.
Due to the long stand-off it is also possible to move over the clamps that attach the part to the fixture eliminating time consuming maneuvering around these clamps.
On some surfaces, a single scan direction provides enough information for the job at hand.
In this case the XC50-LS can work in single stripe mode, increasing the scanning speed with a factor of 3.
This way the XC50-LS offers the strengths of a cross scanner and a traditional line scanner in a single sensor.
The XC50-LS is supported in combination with all major CMM brands.
On the Metris LK range of bridge and horizontal arm CMM, its full functionality can be accessed directly form within Camio Studio.
The resulting point clouds can be further processed in Focus Inspection for feature and part-to-CAD inspection, in Focus Reverse Engineering and a wide range of other point cloud processing packages.